IEEE Transactions on Software Engineering (TSE)

Publications

On the Relationship Between the Developer’s Perceptible Ethnicity and the Evaluation of Contributions in GitHub

Authors: Reza Nadri Gema Rodríguez-Pérez Meiyappan Nagappan

Venue: TSE IEEE Transactions on Software Engineering, Vol. 2104.06143, pp. To appear, 2021

Year: 2021

BibTeX

@article{rezanadri2021otrbtdpeateocig,
    author = "Reza Nadri and Gema Rodríguez-Pérez and Meiyappan Nagappan",
    title = "On the Relationship Between the Developer’s Perceptible Ethnicity and the Evaluation of Contributions in GitHub",
    year = "2021",
    pages = "To appear",
    journal = "IEEE Transactions on Software Engineering",
    volume = "2104.06143"
}

Plain Text

Reza Nadri, Gema Rodríguez-Pérez, and Meiyappan Nagappan, "On the Relationship Between the Developer’s Perceptible Ethnicity and the Evaluation of Contributions in GitHub," IEEE Transactions on Software Engineering, pp. To appear

The Ghost Commit Problem When Identifying Fix-Inducing Changes: An Empirical Study of Apache Projects

Authors: Christophe Rezk Yasutaka Kamei Shane McIntosh

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2021

Year: 2021

BibTeX

@article{christopherezk2021tgcpwifcaesoap,
    author = "Christophe Rezk and Yasutaka Kamei and Shane McIntosh",
    title = "The Ghost Commit Problem When Identifying Fix-Inducing Changes: An Empirical Study of Apache Projects",
    year = "2021",
    pages = "To appear",
    journal = "IEEE Transactions on Software Engineering"
}

Plain Text

Christophe Rezk, Yasutaka Kamei, and Shane McIntosh, "The Ghost Commit Problem When Identifying Fix-Inducing Changes: An Empirical Study of Apache Projects," IEEE Transactions on Software Engineering, pp. To appear

An Empirical Study of Type-Related Defects in Python Projects

Authors: Faizan Khan Boqi Chen Daniel Varro Shane McIntosh

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2021

Year: 2021

BibTeX

@article{faizankhan2021aesotdipp,
    author = "Faizan Khan and Boqi Chen and Daniel Varro and Shane McIntosh",
    title = "An Empirical Study of Type-Related Defects in Python Projects",
    year = "2021",
    pages = "To appear",
    journal = "IEEE Transactions on Software Engineering"
}

Plain Text

Faizan Khan, Boqi Chen, Daniel Varro, and Shane McIntosh, "An Empirical Study of Type-Related Defects in Python Projects," IEEE Transactions on Software Engineering, pp. To appear

Watch out for Extrinsic Bugs! A Case Study of their Impact in Just-In-Time Bug Prediction Models on the OpenStack project

Authors: Gema Rodríguez-Pérez Meiyappan Nagappan Gregorio Robles

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2020

Year: 2020

BibTeX

@article{gemarodríguez-pérez2020wofebacsotiijbpmotop,
    author = "Gema Rodríguez-Pérez and Meiyappan Nagappan and Gregorio Robles",
    title = "Watch out for Extrinsic Bugs! A Case Study of their Impact in Just-In-Time Bug Prediction Models on the OpenStack project",
    year = "2020",
    pages = "To appear",
    journal = "IEEE Transactions on Software Engineering"
}

Plain Text

Gema Rodríguez-Pérez, Meiyappan Nagappan, and Gregorio Robles, "Watch out for Extrinsic Bugs! A Case Study of their Impact in Just-In-Time Bug Prediction Models on the OpenStack project," IEEE Transactions on Software Engineering, pp. To appear

Accelerating Continuous Integration by Caching Environments and Inferring Dependencies

Authors: Keheliya Gallaba Yves Junqueira John Ewart Shane McIntosh

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2020

Year: 2020

BibTeX

@article{keheliyagallaba2020acibceaid,
    author = "Keheliya Gallaba and Yves Junqueira and John Ewart and Shane McIntosh",
    title = "Accelerating Continuous Integration by Caching Environments and Inferring Dependencies",
    year = "2020",
    pages = "To appear",
    journal = "IEEE Transactions on Software Engineering"
}

Plain Text

Keheliya Gallaba, Yves Junqueira, John Ewart, and Shane McIntosh, "Accelerating Continuous Integration by Caching Environments and Inferring Dependencies," IEEE Transactions on Software Engineering, pp. To appear

Quantifying, Characterizing, and Mitigating Flakily Covered Program Elements

Authors: Shivashree Vysali Shane McIntosh Bram Adams

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2020

Year: 2020

BibTeX

@article{shivashreevysali2020qcamfcpe,
    author = "Shivashree Vysali and Shane McIntosh and Bram Adams",
    title = "Quantifying, Characterizing, and Mitigating Flakily Covered Program Elements",
    year = "2020",
    pages = "To appear",
    journal = "IEEE Transactions on Software Engineering"
}

Plain Text

Shivashree Vysali, Shane McIntosh, and Bram Adams, "Quantifying, Characterizing, and Mitigating Flakily Covered Program Elements," IEEE Transactions on Software Engineering, pp. To appear

Code Reviews with Divergent Review Scores: An Empirical Study of the OpenStack and Qt Communities

Authors: Toshiki Hirao Shane McIntosh Akinori Ihara Kenichi Matsumoto

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2020

Year: 2020

BibTeX

@article{toshikihirao2020crwdrsaesotoaqc,
    author = "Toshiki Hirao and Shane McIntosh and Akinori Ihara and Kenichi Matsumoto",
    title = "Code Reviews with Divergent Review Scores: An Empirical Study of the OpenStack and Qt Communities",
    year = "2020",
    pages = "To appear",
    journal = "IEEE Transactions on Software Engineering"
}

Plain Text

Toshiki Hirao, Shane McIntosh, Akinori Ihara, and Kenichi Matsumoto, "Code Reviews with Divergent Review Scores: An Empirical Study of the OpenStack and Qt Communities," IEEE Transactions on Software Engineering, pp. To appear

Use and Misuse of Continuous Integration Features: An Empirical Study of Projects That (Mis)Use Travis CI

Authors: Keheliya Gallaba Shane McIntosh

Venue: TSE IEEE Transactions on Software Engineering, Vol. 46, No. 1, pp. 33-50, 2020

Year: 2020

BibTeX

@article{keheliyagallaba2020uamocifaesopt(tc,
    author = "Keheliya Gallaba and Shane McIntosh",
    title = "Use and Misuse of Continuous Integration Features: An Empirical Study of Projects That (Mis)Use Travis CI",
    year = "2020",
    pages = "33-50",
    journal = "IEEE Transactions on Software Engineering",
    volume = "46",
    number = "1"
}

Plain Text

Keheliya Gallaba and Shane McIntosh, "Use and Misuse of Continuous Integration Features: An Empirical Study of Projects That (Mis)Use Travis CI," IEEE Transactions on Software Engineering, pp. 33-50

Effects of Personality Traits on Pull Request Acceptance

Authors: Rahul Iyer S. Alex Yun Meiyappan Nagappan Jesse Hoey

Venue: TSE IEEE Transactions on Software Engineering, 2019

Year: 2019

BibTeX

@article{rahuliyer2019eoptopra,
    author = "Rahul Iyer and S. Alex Yun and Meiyappan Nagappan and Jesse Hoey",
    title = "Effects of Personality Traits on Pull Request Acceptance",
    year = "2019",
    journal = "IEEE Transactions on Software Engineering"
}

Plain Text

Rahul Iyer, S. Alex Yun, Meiyappan Nagappan, and Jesse Hoey, "Effects of Personality Traits on Pull Request Acceptance," IEEE Transactions on Software Engineering

The Impact of Automated Parameter Optimization on Defect Prediction Models

Authors: Chakkrit Tantithamthavorn Shane McIntosh Ahmed E. Hassan Kenichi Matsumoto

Venue: TSE IEEE Transactions on Software Engineering, Vol. 45, No. 7, pp. 683-711, 2019

Year: 2019

BibTeX

@article{chakkrittantithamthavorn2019tioapoodpm,
    author = "Chakkrit Tantithamthavorn and Shane McIntosh and Ahmed E. Hassan and Kenichi Matsumoto",
    title = "The Impact of Automated Parameter Optimization on Defect Prediction Models",
    year = "2019",
    pages = "683-711",
    journal = "IEEE Transactions on Software Engineering",
    volume = "45",
    number = "7"
}

Plain Text

Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, and Kenichi Matsumoto, "The Impact of Automated Parameter Optimization on Defect Prediction Models," IEEE Transactions on Software Engineering, pp. 683-711

Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction"

Authors: Chakkrit Tantithamthavorn Shane McIntosh Ahmed E. Hassan Kenichi Matsumoto

Venue: TSE IEEE Transactions on Software Engineering, Vol. 42, No. 11, pp. 1092-1094, 2018

Year: 2018

BibTeX

@article{chakkrittantithamthavorn2018co"btuomlisdp,
    author = "Chakkrit Tantithamthavorn and Shane McIntosh and Ahmed E. Hassan and Kenichi Matsumoto",
    title = {Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction"},
    year = "2018",
    pages = "1092-1094",
    journal = "IEEE Transactions on Software Engineering",
    volume = "42",
    number = "11"
}

Plain Text

Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, and Kenichi Matsumoto, "Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction"," IEEE Transactions on Software Engineering, pp. 1092-1094

A Framework for Evaluating the Results of the SZZ Approach for Identifying Bug-Introducing Changes

Authors: Daniel Alencar da Costa Shane McIntosh Weiyi Shang Uirá Kulesza Roberta Coelho Ahmed E. Hassan

Venue: TSE IEEE Transactions on Software Engineering, Vol. 43, No. 7, pp. 641-657, 2017

Year: 2017

BibTeX

@article{danielalencardacosta2017affetrotsafibc,
    author = "Daniel Alencar da Costa and Shane McIntosh and Weiyi Shang and Uirá Kulesza and Roberta Coelho and Ahmed E. Hassan",
    title = "A Framework for Evaluating the Results of the SZZ Approach for Identifying Bug-Introducing Changes",
    year = "2017",
    pages = "641-657",
    journal = "IEEE Transactions on Software Engineering",
    volume = "43",
    number = "7"
}

Plain Text

Daniel Alencar da Costa, Shane McIntosh, Weiyi Shang, Uirá Kulesza, Roberta Coelho, and Ahmed E. Hassan, "A Framework for Evaluating the Results of the SZZ Approach for Identifying Bug-Introducing Changes," IEEE Transactions on Software Engineering, pp. 641-657

The Use of Summation to Aggregate Software Metrics Hinders the Performance of Defect Prediction Models

Authors: Feng Zhang Ahmed E. Hassan Shane McIntosh Ying Zou

Venue: TSE IEEE Transactions on Software Engineering, Vol. 43, No. 5, pp. 476-491, 2017

Year: 2017

BibTeX

@article{fengzhang2017tuostasmhtpodpm,
    author = "Feng Zhang and Ahmed E. Hassan and Shane McIntosh and Ying Zou",
    title = "The Use of Summation to Aggregate Software Metrics Hinders the Performance of Defect Prediction Models",
    year = "2017",
    pages = "476-491",
    journal = "IEEE Transactions on Software Engineering",
    volume = "43",
    number = "5"
}

Plain Text

Feng Zhang, Ahmed E. Hassan, Shane McIntosh, and Ying Zou, "The Use of Summation to Aggregate Software Metrics Hinders the Performance of Defect Prediction Models," IEEE Transactions on Software Engineering, pp. 476-491

An Empirical Comparison of Model Validation Techniques for Defect Prediction Models

Authors: Chakkrit Tantithamthavorn Shane McIntosh Ahmed E. Hassan Kenichi Matsumoto

Venue: TSE IEEE Transactions on Software Engineering, Vol. 43, No. 1, pp. 1-18, 2017

Year: 2017

BibTeX

@article{chakkrittantithamthavorn2017aecomvtfdpm,
    author = "Chakkrit Tantithamthavorn and Shane McIntosh and Ahmed E. Hassan and Kenichi Matsumoto",
    title = "An Empirical Comparison of Model Validation Techniques for Defect Prediction Models",
    year = "2017",
    pages = "1-18",
    journal = "IEEE Transactions on Software Engineering",
    volume = "43",
    number = "1"
}

Plain Text

Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, and Kenichi Matsumoto, "An Empirical Comparison of Model Validation Techniques for Defect Prediction Models," IEEE Transactions on Software Engineering, pp. 1-18

Replicating and re-evaluating the theory of relative defect-proneness

Authors: Mark D. Syer Meiyappan Nagappan Bram Adams Ahmed E. Hassan

Venue: TSE IEEE Transactions on Software Engineering, Vol. 41, No. 2, pp. 176-197, 2014

Preprint: PDF

Year: 2014

BibTeX

@article{markd.syer2014rarttord,
    author = "Mark D. Syer and Meiyappan Nagappan and Bram Adams and Ahmed E. Hassan",
    title = "Replicating and re-evaluating the theory of relative defect-proneness",
    year = "2014",
    pages = "176-197",
    journal = "IEEE Transactions on Software Engineering",
    volume = "41",
    number = "2"
}

Plain Text

Mark D. Syer, Meiyappan Nagappan, Bram Adams, and Ahmed E. Hassan, "Replicating and re-evaluating the theory of relative defect-proneness," IEEE Transactions on Software Engineering, pp. 176-197

The impact of classifier configuration and classifier combination on bug localization

Authors: Stephen W. Thomas Meiyappan Nagappan Dorothea Blostein Ahmed E. Hassan

Venue: TSE IEEE Transactions on Software Engineering, Vol. 39, No. 10, pp. 1427-1443, 2013

Preprint: PDF

Year: 2013

BibTeX

@article{stephenw.thomas2013tioccaccobl,
    author = "Stephen W. Thomas and Meiyappan Nagappan and Dorothea Blostein and Ahmed E. Hassan",
    title = "The impact of classifier configuration and classifier combination on bug localization",
    year = "2013",
    pages = "1427-1443",
    journal = "IEEE Transactions on Software Engineering",
    volume = "39",
    number = "10"
}

Plain Text

Stephen W. Thomas, Meiyappan Nagappan, Dorothea Blostein, and Ahmed E. Hassan, "The impact of classifier configuration and classifier combination on bug localization," IEEE Transactions on Software Engineering, pp. 1427-1443

Using origin analysis to detect merging and splitting of source code entities

Authors: Michael W. Godfrey L. Zou

Venue: TSE IEEE Transactions on Software Engineering, Vol. 31, No. 2, pp. 166-181, 2005

Year: 2005

BibTeX

@article{michaelw.godfrey2005uoatdmasosce,
    author = "Michael W. Godfrey and L. Zou",
    title = "Using origin analysis to detect merging and splitting of source code entities",
    year = "2005",
    pages = "166-181",
    journal = "IEEE Transactions on Software Engineering",
    volume = "31",
    number = "2"
}

Plain Text

Michael W. Godfrey and L. Zou, "Using origin analysis to detect merging and splitting of source code entities," IEEE Transactions on Software Engineering, pp. 166-181

IEEE Transactions on Software Engineering (TSE)

Publications

Authors: Reza Nadri Gema Rodríguez-Pérez Meiyappan Nagappan

Venue: TSE IEEE Transactions on Software Engineering, Vol. 2104.06143, pp. To appear, 2021

Year: 2021

Authors: Christophe Rezk Yasutaka Kamei Shane McIntosh

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2021

Year: 2021

Authors: Faizan Khan Boqi Chen Daniel Varro Shane McIntosh

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2021

Year: 2021

Authors: Gema Rodríguez-Pérez Meiyappan Nagappan Gregorio Robles

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2020

Year: 2020

Authors: Keheliya Gallaba Yves Junqueira John Ewart Shane McIntosh

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2020

Year: 2020

Authors: Shivashree Vysali Shane McIntosh Bram Adams

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2020

Year: 2020

Authors: Toshiki Hirao Shane McIntosh Akinori Ihara Kenichi Matsumoto

Venue: TSE IEEE Transactions on Software Engineering, pp. To appear, 2020

Year: 2020

Authors: Keheliya Gallaba Shane McIntosh

Venue: TSE IEEE Transactions on Software Engineering, Vol. 46, No. 1, pp. 33-50, 2020

Year: 2020

Authors: Rahul Iyer S. Alex Yun Meiyappan Nagappan Jesse Hoey

Venue: TSE IEEE Transactions on Software Engineering, 2019

Year: 2019

Authors: Chakkrit Tantithamthavorn Shane McIntosh Ahmed E. Hassan Kenichi Matsumoto

Venue: TSE IEEE Transactions on Software Engineering, Vol. 45, No. 7, pp. 683-711, 2019

Year: 2019

Authors: Chakkrit Tantithamthavorn Shane McIntosh Ahmed E. Hassan Kenichi Matsumoto

Venue: TSE IEEE Transactions on Software Engineering, Vol. 42, No. 11, pp. 1092-1094, 2018

Year: 2018

Authors: Daniel Alencar da Costa Shane McIntosh Weiyi Shang Uirá Kulesza Roberta Coelho Ahmed E. Hassan

Venue: TSE IEEE Transactions on Software Engineering, Vol. 43, No. 7, pp. 641-657, 2017

Year: 2017

Authors: Feng Zhang Ahmed E. Hassan Shane McIntosh Ying Zou

Venue: TSE IEEE Transactions on Software Engineering, Vol. 43, No. 5, pp. 476-491, 2017

Year: 2017

Authors: Chakkrit Tantithamthavorn Shane McIntosh Ahmed E. Hassan Kenichi Matsumoto

Venue: TSE IEEE Transactions on Software Engineering, Vol. 43, No. 1, pp. 1-18, 2017

Year: 2017

Authors: Mark D. Syer Meiyappan Nagappan Bram Adams Ahmed E. Hassan

Venue: TSE IEEE Transactions on Software Engineering, Vol. 41, No. 2, pp. 176-197, 2014

Preprint: PDF

Year: 2014

Authors: Stephen W. Thomas Meiyappan Nagappan Dorothea Blostein Ahmed E. Hassan

Venue: TSE IEEE Transactions on Software Engineering, Vol. 39, No. 10, pp. 1427-1443, 2013

Preprint: PDF

Year: 2013

Authors: Michael W. Godfrey L. Zou

Venue: TSE IEEE Transactions on Software Engineering, Vol. 31, No. 2, pp. 166-181, 2005

Year: 2005

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